LAUTECH
Pineda de Gyvez, José.;

Integrated circuit defect-sensitivity : theory and computational models / by José Pineda de Gyvez. - New York Kluwer Academic Publishers, c1993 - xxiv, 167 p. : ill. ;

include index.;

9781461363835.;


Integrated circuits--Very large scale integration--Computer-aided design.
Integrated circuits--Very large scale integration--Defects--Mathematical models.

TK7874 / .P53 1993