Electron beam-specimen interactions and simulation methods in microscopy / (Record no. 37277)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00517nam a22001697a 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 231206b ||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9781118456095 |
| 100 ## - MAIN ENTRY--AUTHOR | |
| Author | Mendis, Budhika G. |
| 245 ## - TITLE STATEMENT | |
| Title | Electron beam-specimen interactions and simulation methods in microscopy / |
| Statement of responsibility, etc | Budhika G. Mendis, |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | USA |
| Name of publisher | John Wiley & Sons |
| Date of publication | 2018 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Pagination | x, 279 p.; |
| Other physical details | ill.; |
| 500 ## - GENERAL NOTE | |
| General note | Include index |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term | Electron beams |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term | Electron microscopy |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term | Materials |
| Form subdivision | Analysis |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Item type | Books |
No items available.