TY  - BOOK
AU  -  Mendis, Budhika G.
TI  - Electron beam-specimen interactions and simulation methods in microscopy
SN  - 9781118456095
PY  - 2018///
CY  - USA
PB  - John Wiley & Sons
KW  - Electron beams
KW  - Electron microscopy
KW  - Materials
KW  - Analysis
N1  - Include index
ER  -