000 00442nam a22001457a 4500
999 _c37272
_d37272
008 231205b ||||| |||| 00| 0 eng d
100 _aMENDIS, Budhika G.
245 _aElectron beam-specimen interactions and simulation methods in microscopy /
_cBudhika G. Mendis
260 _aIndia
_bWiley
_c2018
300 _ax, 279p.:
_bills
650 _aElectron beams
650 _aElectron microscopy
650 _aMaterials
_vAnalysis
942 _cBK