| 000 | 00517nam a22001697a 4500 | ||
|---|---|---|---|
| 999 |
_c37277 _d37277 |
||
| 008 | 231206b ||||| |||| 00| 0 eng d | ||
| 020 | _a9781118456095 | ||
| 100 | _a Mendis, Budhika G. | ||
| 245 |
_aElectron beam-specimen interactions and simulation methods in microscopy / _c Budhika G. Mendis, |
||
| 260 |
_aUSA _bJohn Wiley & Sons _c2018 |
||
| 300 |
_ax, 279 p.; _bill.; |
||
| 500 | _aInclude index | ||
| 650 | _aElectron beams | ||
| 650 | _aElectron microscopy | ||
| 650 |
_aMaterials _vAnalysis |
||
| 942 | _cBK | ||