Integrated circuit defect-sensitivity : theory and computational models / by José Pineda de Gyvez.
Material type:
TextPublication details: New York Kluwer Academic Publishers, c1993Description: xxiv, 167 p. : illISBN: - 9781461363835.;
- TK7874 .P53 1993
Books
| Cover image | Item type | Current library | Home library | Collection | Shelving location | Call number | Materials specified | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| OLUSEGUN OKE LIBRARY LAUTECH | Non-fiction | TK 7874 .P53 1993 (Browse shelf(Opens below)) | 1 | Available | 0043132 |
include index.;
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