Integrated circuit defect-sensitivity : theory and computational models /
by Pineda de Gyvez, José.;
[ Books ] Published by : Kluwer Academic Publishers, (New York) Physical details: xxiv, 167 p. : ill. ; ISBN:9781461363835.;.
Subject(s):
Integrated circuits
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Very large scale integration
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Computer-aided design.
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Integrated circuits
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Very large scale integration
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Defects
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Mathematical models.
Year: 1993
Item type:
Books
| Current location | Collection | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
| OLUSEGUN OKE LIBRARY LAUTECH | Non-fiction | TK 7874 .P53 1993 (Browse shelf) | 1 | Available | 0043132 |
include index.;
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